Koh Young to Showcase 3D Inspection Solutions for Advanced Packaging at SEMICON Japan 2024

Koh Young to Showcase 3D Inspection Solutions for Advanced Packaging at SEMICON Japan 2024712370

Koh Young Technology, a global provider of True 3D measurement-based inspection solutions, will demonstrate its award-winning inspection solutions at SEMICON Japan Hall 1 Booth 1310 at Tokyo Big Sight on December 12-13, 2024. The team of experts will discuss how their inspection solutions can boost quality and increase yield for advanced and wafer-level packaging. Their inspection experts will highlight three machines: Meister S, Meister D+, and ZenStar.

Meister S

Premium In-line 3D Inspection System for Micro Solder Paste Deposits. The Meister S has been qualified for mass production by major semiconductor foundries and Mini/Micro-LED companies for micro-solder inspection with superior full 3D inspection performance. Combining innovative vision algorithms and high-resolution optics, the Meister S goes beyond micro solder paste inspection, but also a proven solution for Flux inspection.

Meister D+

The Meister D+ combines industry-leading Moiré technology and Koh Young’s proprietary new optics to support 3D inspection of highly reflective dies, a long-term inspection challenge. Koh Young Technology leverages its expertise in 3D measurement and inspection to address the precise inspection of wafer surfaces, critical dimension measurement, defect detection, and the analysis of complex structures found in semiconductor devices.

ZenStar

The ZenStar, making its debut at SEMICON Japan, supports True 3D inspection of highly reflective dice with a mirror surface. Its unparalleled 2D/3D multi-modal technology combines industry-leading Moiré technology and new Koh Young proprietary optics to provide robust and stable inspection for bleeding-edge applications. With its proprietary deep learning technology, the ZenStar offers enhanced capabilities to inspect defective items like micro-cracks, foreign material, and chipping.

Visit and Elevate Your Inspection Capabilities

For more information about how Koh Young’s award-winning solutions can elevate your production quality and solve your most challenging inspection needs, visit them at SEMICON Japan Hall 1 Booth 1310. Utilize this opportunity to engage with their experts, experience their innovative technologies firsthand, and discover how they can help you achieve new levels of efficiency in your manufacturing processes.

Click here to learn more about Meister S.

Click here to learn more about Meister D+.

Click here to learn more about ZenStar.

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