TR7500 SIII Ultra DL

The TR7500 SIII Ultra DL from Test Research, Inc. is an Automated Optical Inspection (AOI) system that uses dynamic imaging technology for imaging. It can handle PCB sizes of up to 510 x 310 mm in dual-lane mode or 510 x 590 mm in single-lane mode, with a board thickness range of 0.6 to 5 mm. Equipped with a 4 MP high-speed color top camera and four angled cameras, the system supports resolutions of 10 μm and 15 μm, achieving inspection speeds of up to 120 cm²/s. It uses a multi-phase RGB+W LED lighting system, enabling reliable detection of defects such as missing, tombstoning, billboarding, polarity errors, component rotation or shift, wrong marking (OCV), lifted leads, bridging, solder defects, through-hole pin issues, golden finger wear, scratches, and contamination. 

The TR7500 SIII Ultra DL has a motion table with a Ballscrew + AC Servo with Motion Controller providing an X-Y axis resolution of 1 μm for stable and repeatable inspection accuracy. The system integrates multi-camera side-view inspection, AI-powered defect detection algorithms, and TRI’s AOM metrology-grade measurement features, along with 3D profile measurements enabled by a laser module. It has a footprint of 1365 x 1720 x 1710 mm.